Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Big bigCover of Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

More books from Springer New York

bigCover of the book Reviews of Environmental Contamination and Toxicology by

bigCover of the book Integrated Optics by

bigCover of the book Mindful Parenting by

bigCover of the book Resource Management for Heterogeneous Networks in LTE Systems by

bigCover of the book Bounded Noises in Physics, Biology, and Engineering by

bigCover of the book Commodities, Energy and Environmental Finance by

bigCover of the book Handbook of Augmented Reality by

bigCover of the book Cancer Caregiving in the United States by

bigCover of the book Self-injurious Behavior by

bigCover of the book Lithium-Ion Batteries by

bigCover of the book Design, Analysis, and Interpretation of Genome-Wide Association Scans by

bigCover of the book Alien Gene Transfer in Crop Plants, Volume 1 by

bigCover of the book Mental Modeling Approach by

bigCover of the book Advances in Systems Biology by

bigCover of the book Noise-Driven Phenomena in Hysteretic Systems by

We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy